Characteristic Charge Collection Mechanism Observed in FinFET SRAM Cells

Autor:	Kozo Takeuchi, Keita Sakamoto, Kazuki Yukumatsu, Kyota Watanabe, Yuta Tsuchiya, Takashi Kato, Hideya Matsuyama, Akinori Takeyama, Takeshi Ohshima, Satoshi Kuboyama, Hiroyuki Shindo
Rok vydání:	2022
Předmět:	Nuclear and High Energy Physics Nuclear Energy and Engineering Electrical and Electronic Engineering
Zdroj:	IEEE Transactions on Nuclear Science. 69:1833-1839
ISSN:	1558-1578 0018-9499
DOI:	10.1109/tns.2022.3188993
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::29273aa201941548ee5e27be48bb3b89 https://doi.org/10.1109/tns.2022.3188993 Zobrazit plný text záznamu