| Autor: |
C. Couillaud, C. Remond, J. M. Esteva, Denis Cubaynes, J. Lachkar, Jean-Marc Bizau, D. Hitz, J. Delaunay, J. Bruneau, Christophe P. Blancard, P. Ludwig, R. Marmoret, A. Compant La Fontaine, F. J. Wuilleumier |
| Rok vydání: |
2000 |
| Předmět: |
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| Zdroj: |
AIP Conference Proceedings. |
| ISSN: |
0094-243X |
| Popis: |
We present new results obtained on photoionization processes in Xe3+ to Xe7+ ions, using ion spectrometry. The experiment combines for the first time a beam of multiply-charged ions produced in an electron cyclotron resonance (ECR) ion source and a beam of synchrotron radiation emitted from an undulator. These results provide a complete picture of the behavior of resonant and continuum photoionization processes along the Xe isonuclear sequence, following the complete stripping, electron by electron, of the 5p subshell.We present new results obtained on photoionization processes in Xe3+ to Xe7+ ions, using ion spectrometry. The experiment combines for the first time a beam of multiply-charged ions produced in an electron cyclotron resonance (ECR) ion source and a beam of synchrotron radiation emitted from an undulator. These results provide a complete picture of the behavior of resonant and continuum photoionization processes along the Xe isonuclear sequence, following the complete stripping, electron by electron, of the 5p subshell. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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