Improved Accelerated Durability Testing and Comparison to Field Degradation
| Autor: | Gambogi, W.J., Felder, T., MacMaster, S., Roy-Choudhury, K., Yu, B.-L., Garreau-Iles, L., Hu, H., Trout, T.-J. |
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| Jazyk: | angličtina |
| Rok vydání: | 2017 |
| Předmět: | |
| DOI: | 10.4229/eupvsec20172017-5dv.3.13 |
| Popis: | 33rd European Photovoltaic Solar Energy Conference and Exhibition; 1774-1778 It is important that accelerated test methodologies applied to photovoltaic modules address the key stresses applied to a photovoltaic module dominant in the field and reproduce the degradation observed in the field. Typically, durability is assessed based on extended exposure to the module qualification conditions but these stress conditions are intended to assess resistance to early life failures and not long-term durability. Multiple stress test protocols have been developed for crystalline silicon based photovoltaic modules that include temperature, humidity, thermal cycling, humidity freeze, direct UV from the front, UV from the back, and internal applied voltage. At elevated levels of stress, faster degradation is achieved and can be compared to field degradation. Test conditions must be carefully considered to be sure that the degradation mechanisms match the field. Sequential tests have been developed at DuPont and results are compared to field inspections and assessment of changes in materials properties observed in the field. Comparison of the performance of different materials and insights into these changes are applied. We use non-destructive testing including current-voltage, electroluminescent imaging and thermal imaging to assess performance. We use destructive testing of fielded modules to better understand the root cause of failures and the relationship to materials changes observed in accelerated testing and fielded modules. |
| Databáze: | OpenAIRE |
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