Solid-state detector for ICP-OES
| Autor: | Dennis A. Yates, Thomas W. Barnard, Peter A. Levine, Juan C. Ivaldi, Michael I. Crockett, Donald J. Sauer, Peter L. Lundberg |
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| Rok vydání: | 1993 |
| Předmět: | |
| Zdroj: | Analytical Chemistry. 65:1231-1239 |
| ISSN: | 1520-6882 0003-2700 |
| DOI: | 10.1021/ac00057a021 |
| Popis: | A new type of solid-state detector has been designed to meet the needs of inductively coupled plasma optical emission spectroscopy (ICP-OES), including high quantum efficiency in the UV, low noise, wide dynamic range, rapid readout, broad spectral coverage, and high spectral resolution. The device is based on buried-channel charge-coupled-device (CCD) technology with unique features for optical emission spectroscopy and is matched to a specific echelle grating optical system described in the companion paper. It measures simultaneously 5.7% of the continuous ICP spectrum from 167 to 782 nm with 220 linear photodetector arrays. These arrays are targeted on three to four primary analytical lines for each of 72 elements and cover over 5000 ICP emission lines |
| Databáze: | OpenAIRE |
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