Low-temperature luminescence of exciton and defect states in heteroepitaxial GaN grown by hydride vapor phase epitaxy
Autor: | Brian Skromme, R. P. Vaudo, J. Jayapalan, V. M. Phanse |
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Rok vydání: | 1999 |
Předmět: | |
Zdroj: | Applied Physics Letters. 74:2358-2360 |
ISSN: | 1077-3118 0003-6951 |
DOI: | 10.1063/1.123850 |
Popis: | Low-temperature (1.7–20 K) photoluminescence and reflectance are used to investigate the free and bound exciton and shallow impurity states in GaN. A 300-μm-thick GaN layer grown by hydride vapor phase epitaxy on sapphire(0001), with an exceptionally low dislocation density (3×106 cm−2) is used to obtain very high quality spectra. Both free and bound n=2 excitons are identified, leading to a confirmation of the A free exciton binding energy as about 26.4 meV, independent of strain. Principal neutral donor-bound exciton (D0,X) peaks involving two to three different donors are resolved, as are two-electron satellites involving up to five different residual donors with binding energies ranging from 22 to 34.5 meV. |
Databáze: | OpenAIRE |
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