Loopback or not? (loopback testing)
| Autor: | T.J. Yamaguchi |
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| Rok vydání: | 2005 |
| Předmět: | |
| Zdroj: | 2004 International Conferce on Test. |
| DOI: | 10.1109/test.2004.1387442 |
| Popis: | For the verification of high-speed serial I/O devices, a new architecture, which is different from the conventional ET sampling method, must be developed to measure ultra-wideband jitter in the bit stream transmitted from a multi-Gb/s physical layer IC. For testing in a high-volume test environment, our challenge is to find a way to test the jitter tolerance of Rx that is more effective than the conventional loopback test. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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