Rapid Pre-Characterization of Fine-Grained EM Side-Channel (In)Vulnerability of AES Modules

Autor:	Vishnuvardhan V. Iyer, Ali E. Yilmaz
Rok vydání:	2022
Zdroj:	2022 IEEE USNC-URSI Radio Science Meeting (Joint with AP-S Symposium).
DOI:	10.23919/usnc-ursi52669.2022.9887440
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::27f92e0efcdb1a889f2c78729eddfb7b https://doi.org/10.23919/usnc-ursi52669.2022.9887440 Zobrazit plný text záznamu