Determination of A-site deficiency in lanthanum manganite by XRD intensity ratio
| Autor: | Yanbo Zuo, Zhongbing Wang, Jianxin Yi, Jian-heng Li, Chusheng Chen |
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| Rok vydání: | 2008 |
| Předmět: |
Diffraction
Materials science Analytical chemistry Mineralogy Crystal growth Condensed Matter Physics Manganite Crystallographic defect Electronic Optical and Magnetic Materials Inorganic Chemistry chemistry.chemical_compound Lanthanum manganite chemistry Electrical resistivity and conductivity X-ray crystallography Materials Chemistry Ceramics and Composites Physical and Theoretical Chemistry Perovskite (structure) |
| Zdroj: | Journal of Solid State Chemistry. 181:700-704 |
| ISSN: | 0022-4596 |
| DOI: | 10.1016/j.jssc.2007.12.033 |
| Popis: | A method based on the X-ray diffraction intensity ratio was developed to determine the maximum deficiency that the perovskite-structured La1−xMnO3±δ can accommodate at the A-site. Computer simulation predicts that the intensity ratio of (024) and (012) reflections for La1−xMnO3±δ in hexagonal setting increases with increasing the La deficiency x. XRD analysis shows that with increasing x until 0.09, the ratio increases as predicted, then levels off with further increase in x. An abrupt change in electrical conductivity is also observed at x of ∼0.10. It is concluded that the maximum deficiency lies in between 0.09 and 0.10 for La1−xMnO3±δ. The methodology presented in this paper in principle can be applied to other perovskite-structured materials. |
| Databáze: | OpenAIRE |
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