Multi-Ported Register File for Reducing the Impact of PVT Variation

Autor: Masaya Sumita, Yuuichirou Ikeda, Makoto Nagata
Rok vydání: 2006
Předmět:
Zdroj: IEICE Transactions on Electronics. :356-363
ISSN: 1745-1353
0916-8524
Popis: We have developed a 32-bit, 32-word, and 9-read, 7-write ported register file. This register file has several circuits and techniques for reducing the impact of process variation that is marked in recent process technologies, voltage variation, and temperature variation, so called PVT variation. We describe these circuits and techniques in detail, and confirm their effects by simulation and measurement of the test chip.
Databáze: OpenAIRE