Hard disk magnetic domain nano-spatial resolution imaging by using a near-field scanning microwave microscope with an AFM probe tip

Autor:	Arsen Babajanyan, Seungwan Kim, Kiejin Lee, Harutyun Melikyan, Jongchel Kim, Barry Friedman, Tigran Sargsyan
Rok vydání:	2009
Předmět:	Scanning Hall probe microscope Microscope Materials science Magnetic domain business.industry Near and far field Condensed Matter Physics Electronic Optical and Magnetic Materials law.invention Magnetic field Optics law Magnetic force microscope Tuning fork business Image resolution
Zdroj:	Journal of Magnetism and Magnetic Materials. 321:2483-2487
ISSN:	0304-8853
Popis:	A near-field scanning microwave microscope (NSMM) incorporating an atomic force microscope (AFM) probe tip was used for the direct imaging of magnetic domains of a hard disk under an external magnetic field. We directly imaged the magnetic domain changes by measuring the change of reflection coefficient S11 of the NSMM at an operating frequency near 4.4 GHz. Comparison was made to the magnetic force microscope (MFM) image. Using the AFM probe tip coupled to the tuning fork distance control system enabled nano-spatial resolution. The NSMM incorporating an AFM tip offers a reliable means for quantitative measurement of magnetic domains with nano-scale resolution and high sensitivity.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::276ce2b627e1f3460ff51f79cafad063 https://doi.org/10.1016/j.jmmm.2009.03.068 Zobrazit plný text záznamu Full Text from ScienceDirect