Combined scanning near field optical and force microscopy

Autor:	N.F. van Hulst, M.H.P. Moers, B. Bölger, R. G. Tack
Rok vydání:	1993
Předmět:	Histology Electron probe microanalysis Materials science Silicon business.industry chemistry.chemical_element Near and far field Medical Laboratory Technology Optics chemistry Microscopy Near-field scanning optical microscope Anatomy Tin business Instrumentation Indium
Zdroj:	Microscopy Research and Technique. 25:177-178
ISSN:	1059-910X
DOI:	10.1002/jemt.1070250212
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::272e6bb164a4f67809eff096c7dcc349 https://doi.org/10.1002/jemt.1070250212 Zobrazit plný text záznamu Plný text