| Autor: |
Arnold Giske, Hilmar Gugel, Marcus Dyba, Dietmar Gnass, Volker Seyfried, Jochen Sieber |
| Rok vydání: |
2010 |
| Předmět: |
|
| Zdroj: |
Solid State Lasers XIX: Technology and Devices. |
| ISSN: |
0277-786X |
| Popis: |
STED microscopy has gained recognition as a method to break the diffraction limit of conventional light microscopy. Despite being a new technique, STED is already successfully implemented in life science research. The resolution enhancement is achieved by depleting fluorescent markers via stimulated emission. The performance is significantly dependent on the laser source and the fluorescence markers. Therefore the use of novel fluorescent markers in conjunction with the right laser system was the main focus of our research. We present new developments and applications of STED microscopy, unraveling structural details on scales below 90nm and give an overview of required specifications for the solid state laser systems. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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