| Autor: |
Senling Wang, Tsutomu Inamoto, Hiroshi Takahashi, Yoshinobu Higami, Tomokazu Nakamura, Kewal K. Saluja |
| Rok vydání: |
2019 |
| Předmět: |
|
| Zdroj: |
2019 34th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC). |
| DOI: |
10.1109/itc-cscc.2019.8793429 |
| Popis: |
Field testing and field diagnosis are effective ways for achieving high reliability of modern systems. Since they are executed during an idle mode or a start-up mode in a system, they must be completed within very short time. Adaptive diagnosis applies test patterns selectively according to a candidate faults set that is obtained during the fault diagnosis process. In this paper, we propose an adaptive fault diagnosis method using a compact dictionary in order to reduce compute time for deducing candidate faults. A compact dictionary is created by compacting some output values into one bit. Although the compute time is reduced using a compact dictionary, the number of applied test patterns for diagnosis may increase in some cases. We investigate the relation between the size of a compact dictionary, compute time and the number of test patterns by experiments for benchmark circuits. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
