Ultra-small and ultra-reliable innovative fuses scalable from 0.35um to 28nm

Autor:	Wen-Kuan Fang, Lupin Lin, Shine Chung, Jy Hsiao, YC Hsu, Wen-Hua Yu
Rok vydání:	2016
Předmět:	Engineering Current distribution business.industry Program Efficiency Scalability Electronic engineering Electrical engineering Fuse (electrical) Critical current business Diode
Zdroj:	2016 International Conference on Microelectronic Test Structures (ICMTS).
DOI:	10.1109/icmts.2016.7476195
Popis:	I-fuse is a fuse-based technology having (a) 1R1D cell, (b) limited programming below a critical current, and (c) small cell to improve program efficiency to pass qualification at 300°C for 4,290 hours. Test structures consist of single 1R1D structure and mini-arrays are used to characterize (a) critical current, (b) diode characteristics, and (c) cell current distribution.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::265228146d852a04343279fcc4c80993 https://doi.org/10.1109/icmts.2016.7476195 Zobrazit plný text záznamu