| Popis: |
TFT-LCD generally has the intrinsic non-uniformity due to the variance of the backlight. The region that has the perceptible non-uniformity is defined as a defect, called area-mura. In this paper, we present a new segmentation method for detecting area-mura. We first extract candidates of area-muras using regression diagnostics and then select the real area-muras among those candidates based on the size and SEMU index, a measure of contrast based on human brightness perception. Performance of the presented method has been evaluated on those TFT-LCD panel samples provided by Samsung Electronics Co., Ltd. |
