A shared built-in self-repair analysis for multiple embedded memories

Autor: Jun Ohtani, Tomoya Kawagoe, M. Niiro, M. Maruta, Tsukasa Ooishi, Hideto Hidaka
Rok vydání: 2002
Předmět:
Zdroj: Proceedings of the IEEE 2001 Custom Integrated Circuits Conference (Cat. No.01CH37169).
DOI: 10.1109/cicc.2001.929752
Popis: A shared built-in self-repair analysis scheme (Shared-BISA) for multiple embedded memory cores in the SOC is proposed to realize minimum area penalty independent of the number of embedded memory cores. A compact reconfigurable CAM array in the BISA circuitry realizes a flexible redundancy analysis structure to cope with various memory core and redundancy structures, and a high-speed operation up to 500 MHz.
Databáze: OpenAIRE