Materials science education: ion beam modification and analysis of materials

Autor:	Claudiu Muntele, Robert Lee Zimmerman, Daryush Ila
Rok vydání:	2012
Předmět:	Nuclear and High Energy Physics Radiation Materials science Ion beam Analytical chemistry Condensed Matter Physics Rutherford backscattering spectrometry Focused ion beam Ion Ion beam deposition Ion implantation Nuclear reaction analysis General Materials Science Irradiation
Zdroj:	Radiation Effects and Defects in Solids. 167:577-582
ISSN:	1029-4953 1042-0150
DOI:	10.1080/10420150.2012.668696
Popis:	The Center for Irradiation of Materials (CIM) at Alabama A&M University (http://cim.aamu.edu) was established in 1990 to serve the University in its research, education and services to the need of the local community and industry. CIM irradiation capabilities are oriented around two tandem-type ion accelerators with seven beam lines providing high-resolution Rutherford backscattering spectrometry, MeV focus ion beam, high-energy ion implantation and irradiation damage studies, particle-induced X-ray emission, particle-induced gamma emission and ion-induced nuclear reaction analysis in addition to fully automated ion channeling. One of the two tandem ion accelerators is designed to produce high-flux ion beam for MeV ion implantation and ion irradiation damage studies. The facility is well equipped with a variety of surface analysis systems, such as SEM, ESCA, as well as scanning micro-Raman analysis, UV–VIS Spectrometry, luminescence spectroscopy, thermal conductivity, electrical conductivity, IV/CV system...
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::259bb0e1886957305c372412a26ad244 https://doi.org/10.1080/10420150.2012.668696 Zobrazit plný text záznamu Plný text ve formátu PDF Plný text ve formátu HTML
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