Tunneling Emitter Bipolar Transistor as a Characterization Tool for Dielectrics and their Interfaces

Autor: Eilam Yalon, Arkadi Gavrilov, Shimon Cohen, David Mistele, Boris Meyler, Joseph Salzman, Dan Ritter
Rok vydání: 2011
Zdroj: ECS Meeting Abstracts. :1917-1917
ISSN: 2151-2043
DOI: 10.1149/ma2011-02/27/1917
Popis: not Available.
Databáze: OpenAIRE