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The present work aimed to investigate the electrochemical properties of ITO substrates in propylene carbonate (PC) with 0.5 mol/L lithium perchlorate (LiClO4) medium in the presence of elaborated thin films of cerium dioxide pure and doped with manganese at varying percentages Ce1–xMnxO2 (x=0 wt%, 2 wt%, 4 wt% and 6 wt%) were successfully deposited by the spray pyrolysis (SP) technique on the glass substrate and ITO at 450 °C.The effects of manganese (Mn) doping thin films Ce1–xMnxO2 were studied and investigated by using different analyses namely X-ray diffraction (XRD) analysis, Raman spectroscopy method, UV-Vis spectrophotometer technique, atomic force microscopy (AFM) analysis and electrochemical properties. XRD data obtained present a polycrystalline with a face-centred cubic structure of fluorite type. Raman results of thin films undoped and Mn doped show two peaks at 465 and 600 cm–1, this letter due to the formation of extrinsic oxygen vacancies by the incorporation of Mn rate into Ce1–xMnxO2 matrix. Energy dispersive spectroscopy (EDS) data show the presence of Ce, O, and Mn elements in the elaborated films. The AFM results reveal that the surface roughness decreases with increasing Mn rate. Further, band gap energy of thin films decreases with increasing in Mn rate due to the formation of defect state between valence and conduction band. The storage capacity of the elaborated (Ce1–xMnxO2/ITO/PC+LiClO4) electrode reaches a maximum of 1.997 mF in the presence of 6% of Mn. |
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