| Autor: |
Chang Hun Lee, Ju Hee Noh, Hyeon Deok Lee, Young Sub You, Seok Jae Kim, Kong Soo Lee, Yong Woo Hyung, Gil Hwan Son, Daehan Yoo, Jae Jong Han, Yong Kwon Kim |
| Rok vydání: |
2006 |
| Předmět: |
|
| Zdroj: |
Japanese Journal of Applied Physics. 45:L1193-L1196 |
| ISSN: |
0021-4922 |
| DOI: |
10.1143/jjap.45.l1193 |
| Popis: |
Germanium (Ge) ion implantation was investigated for crystallinity enhancement during solid phase epitaxial (SPE) regrowth. Electron back-scatter diffraction (EBSD) measurement showed numerical increase of 19% of (100) signal, which might be due to the effect of pre-amorphization implantation (PAI) on silicon layer. On the other hand, electrical property such as off-leakage current of n-channel metal oxide semiconductor (NMOS) transistor degraded in specific regions of wafers. It was confirmed that arsenic (As) atoms were incorporated into channel area during Ge ion implantation. Since the equipment for Ge PAI was using several source gases such as BF3 and AsH3, atomic mass unit (AMU) contamination during PAI of Ge with AMU 74 caused the incorporation of As with AMU 75 which resided in arc-chamber and other parts of the equipment. It was effective to use Ge isotope of AMU 72 to suppress AMU contamination. It was effective to use enriched Ge source gas with AMU 72 in order to improve productivity. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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