Determination of boron by the method of wave dispersion x-ray fluorescent spectrometry

Autor: N. V. Yakovlev, S. Ulig, L. Muller
Rok vydání: 1999
Předmět:
Zdroj: Refractories and Industrial Ceramics. 40:313-316
ISSN: 1573-9139
1083-4877
DOI: 10.1007/bf02762577
Popis: Determination of boron concentration has become a usual application of x-ray spectrometers. Optimization of the system parameters has reduced the minimum detectable concentrations to a level below 0.1%. At the same time, XRFA provides a maximum reproducibility of results even at low boron concentrations. However, the most important factor is the short time that passes from the preparation of the specimen to displaying the measured data. The latter factor explains the increasing success of XRF spectrometry in analyzing the quality of products in the ceramic and glass industries
Databáze: OpenAIRE