Summary Abstract: Structure analysis of the GaAs(110) surface by scanning tunneling microscopy
| Autor: | Aaron P. Fein, Jerry Tersoff, Joseph A. Stroscio, Randall M. Feenstra |
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| Rok vydání: | 1988 |
| Předmět: |
Materials science
business.industry Scanning tunneling spectroscopy Scanning confocal electron microscopy Spin polarized scanning tunneling microscopy Surfaces and Interfaces Conductive atomic force microscopy Scanning capacitance microscopy Condensed Matter Physics Electrochemical scanning tunneling microscope Surfaces Coatings and Films law.invention Scanning probe microscopy law Optoelectronics Scanning tunneling microscope business |
| Zdroj: | Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 6:497-498 |
| ISSN: | 1520-8559 0734-2101 |
| DOI: | 10.1116/1.575367 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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