Thickness and Substrate Dependent Thin Film Growth of Picene and Impact on the Electronic Structure
| Autor: | Nobuo Ueno, Yoshihiro Kubozoro, Satoshi Kera, Fabio Bussolotti, Keiichirou Yonezawa, Alexei Vorobiev, Christopher Lorch, Alexander Gerlach, Takuya Hosokai, Frank Schreiber, Yoichi Yamada, Yuri Hasegawa, Alexander Hinderhofer |
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| Rok vydání: | 2015 |
| Předmět: |
Diffraction
Materials science Electronic structure Substrate (electronics) Surfaces Coatings and Films Electronic Optical and Magnetic Materials chemistry.chemical_compound Crystallography General Energy Picene chemistry Zigzag Chemical physics Molecule Graphite Physical and Theoretical Chemistry Thin film |
| Zdroj: | The Journal of Physical Chemistry C. 119:29027-29037 |
| ISSN: | 1932-7455 1932-7447 |
| Popis: | Thickness and substrate dependence of film growth, morphology, unit-cell structure, and electronic structures was thoroughly investigated for picene, the zigzag connected 5-ring molecule, by employing complementary techniques of in situ real-time X-ray reflectivity/diffraction, in situ electron spectroscopies, and atomic force microscopy. A different kind of thickness dependent structural transition was observed on SiO2 and graphite, resulting in a distinct electronic structure. On SiO2 picene films with 3D crystalline domains are formed with nearly upright molecular orientation from the initial growth stage. With increasing the film thickness the in-plane dimensions of the unit cell in the initially grown domains become smaller (in other words, more compressed), and, at the same time, crystalline domains with a more relaxed structure are nucleating on top of the compressed domains. In spite of such structural changes, the electronic structure, namely energy position of the highest occupied molecular orbi... |
| Databáze: | OpenAIRE |
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