Anomalous Thermal Expansion in Ta2WO8 Oxide Semiconductor over a Wide Temperature Range
| Autor: | Yan Luo, Yu Jia, Jia-Qi Wang, Mingju Chao, Xiao Ren, Qilong Gao, Juan Guo, Erjun Liang, Yongqiang Qiao, Qiang Sun |
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| Rok vydání: | 2021 |
| Předmět: | |
| Zdroj: | Inorganic Chemistry. 60:17758-17764 |
| ISSN: | 1520-510X 0020-1669 |
| Popis: | Expansion of material is one of the major impediments in the high precision instrument and engineering field. Low/zero thermal expansion compounds have drawn great attention because of their important scientific significance and enormous application value. However, the realization of low thermal expansion over a wide temperature range is still scarce. In this study, a low thermal expansion over a wide temperature range has been observed in the Ta2WO8 oxide semiconductor. It is a balance effect of the negative thermal expansion of the a axis and the positive thermal expansion of the b axis and the c axis to achieve low thermal expansion behavior. The results of the means of variable temperature X-ray diffraction and variable pressure Raman spectroscopy analysis indicated that the transverse vibration of bridging oxygen atoms is the driving force, which is corresponding to the low-frequency lattice modes with a negative Gruneisen parameter. The present study provides one wide band gap semiconductor Ta2WO8 with anomalous thermal expansion behavior. |
| Databáze: | OpenAIRE |
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