Heterogeneous flow and brittle failure in shock-compressed silicon

Autor:	Jue Wang, Peter M. Celliers, B. D. Hammel, Jon Eggert, Gilbert Collins, Stephanie Brygoo, David J. Erskine, Cynthia Bolme, R. F. Smith, Suzanne Ali
Rok vydání:	2013
Předmět:	Materials science Silicon Condensed matter physics business.industry General Physics and Astronomy chemistry.chemical_element Fracture mechanics Velocimetry Plasticity Velocity interferometer system for any reflector Brittleness Optics chemistry Surface roughness Particle velocity business
Zdroj:	Journal of Applied Physics. 114:133504
ISSN:	1089-7550 0021-8979
Popis:	We combine a recently developed high-resolution two-dimensional (2D) imaging velocimetry technique (velocity interferometer system for any reflector (VISAR)) with 1D VISAR measurements to construct a moving picture of heterogeneous deformation in shock-compressed single crystal silicon. The 2D VISAR takes an intensity snapshot of target velocity and reflectivity over a mm field-of-view while the compression history is simultaneously recorded by the 1D VISAR. Our data show particle velocity surface roughening due to the anisotropic onset of plasticity and, above ∼13 GPa, a structural phase transformation. Shock arrival at the Si free-surface is characterized by the formation of fracture networks and incipient velocity jetting.
Databáze:	OpenAIRE
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