High reliability, high-yield, high modulation bandwidth, low threshold current 1.55 μm MQW laser by new in-situ etching technique

Autor:	M. Meliga, D. Bertone, Roberto Paoletti, S. Murgia, R. Campi, Giuliana Morello, Ruiyu Fang
Rok vydání:	2002
Předmět:	Yield (engineering) Threshold current Materials science In situ etching business.industry Laser law.invention Modulation bandwidth Semiconductor Optics Reliability (semiconductor) law Etching (microfabrication) Optoelectronics business
Zdroj:	24th European Conference on Optical Communication. ECOC '98 (IEEE Cat. No.98TH8398).
DOI:	10.1109/ecoc.1998.732443
Popis:	For the first time to our knowledge, an InP based Fabry-Perot MQW semiconductor laser is obtained by using an in-situ etching technique. Good static and dynamic laser characteristics together with high process yield and reliability confirm the validity of this new technological process.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::24761ebb6c6e6d7ed4e4a38d8c940c9d https://doi.org/10.1109/ecoc.1998.732443 Zobrazit plný text záznamu