The influence of the CeO2 buffered r-sapphire microstructure on the quality of the YBCO films determined by microwave measurements

Autor:	Vladimír Štrbík, Marianna Španková, P. Gierlowski, Š. Beňačka, S.J. Lewandowski, Stefan Chromik, Š. Gaži, Ivo Vávra
Rok vydání:	2002
Předmět:	Laser ablation Materials science Annealing (metallurgy) Mineralogy Sputter deposition Condensed Matter Physics Microstructure Surfaces Coatings and Films Pulsed laser deposition Cavity magnetron Sapphire Composite material Thin film Instrumentation
Zdroj:	Vacuum. 69:277-282
ISSN:	0042-207X
DOI:	10.1016/s0042-207x(02)00345-7
Popis:	Superconducting YBa 2 Cu 3 O 7 (YBCO) thin films were prepared by different deposition techniques (magnetron sputtering, laser ablation) on CeO 2 buffered r-sapphire substrates. A zero magnetic field microwave absorption measurement was used to characterize the transition of the YBCO films to the superconducting state. The obtained results were compared with the crystallographic properties (Δ ω values, morphology) of the substrates, CeO 2 buffer layers and finally with the YBCO films. Especially, we discuss about the influence of the deposition and annealing of the CeO 2 layers on the electrical properties of the YBCO films. Using rocking curve measurements, AFM and TEM analyses there were revealed structural differences in the CeO 2 layer which affect the superconducting behaviour of the YBCO films. We optimized the technological processes of the CeO 2 preparation to enhance the quality of YBCO films.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2460cec48d5524ea067397029826c863 https://doi.org/10.1016/s0042-207x(02)00345-7 Zobrazit plný text záznamu Full Text from ScienceDirect