Recording of the Nanoscale Displacements of the Probe of a Near-Field Microwave Microscope by Means of a Semi-Conductor Laser Auto-dyne

Autor:	A. V. Skripal, D. A. Usanov, S. Yu. Dobdin, E. I. Astakhov
Rok vydání:	2018
Předmět:	Microscope Materials science business.industry Near and far field Dyne Laser law.invention Optics Semiconductor Control and Systems Engineering law Electrical and Electronic Engineering business Nanoscopic scale Microwave
Zdroj:	Nano- i Mikrosistemnaya Tehnika. 20:3-10
ISSN:	1813-8586
DOI:	10.17587/nmst.20.3-10
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::236618be23e730298954332d3eb3edc2 https://doi.org/10.17587/nmst.20.3-10 Zobrazit plný text záznamu