Formation of n-type Ge on insulator by low-temperature Sb-induced layer exchange crystallization

Autor: Masanobu Miyao, Hongmiao Gao, Masaya Sasaki, Rikuta Aoki, Taizoh Sadoh
Rok vydání: 2017
Předmět:
Zdroj: 2017 17th International Workshop on Junction Technology (IWJT).
DOI: 10.23919/iwjt.2017.7966503
Popis: Low temperature (≤500°C) formation of n-type crystalline Ge films on insulator is required to achieve the next-generation large-scale integrated circuits (LSI), where optical functions are merged. This is because n-type Ge shows high-efficiency optical functions owing to high electron population in the Γ band.
Databáze: OpenAIRE