Investigation of thin oxide57Fe films by Mössbauer total external reflection
| Autor: | A. Yu. Sokolov, Genadii N. Belozerskii, S. M. Irkaev, N. V. Shumilova, Valentin Semenov, Marina A. Andreeva |
|---|---|
| Rok vydání: | 1991 |
| Předmět: |
chemistry.chemical_classification
Condensed matter physics Chemistry Mineralogy Substrate (electronics) Condensed Matter Physics Spectral line Electronic Optical and Magnetic Materials Total external reflection Mössbauer spectroscopy Thin film Layer (electronics) Hyperfine structure Inorganic compound |
| Zdroj: | Physica Status Solidi (a). 127:455-464 |
| ISSN: | 1521-396X 0031-8965 |
| Popis: | Depth selectivity of Mossbauer total external reflection (TER) is demonstrated. A series of CEMS spectra at different glancing angles of an evaporated 20 nm 57Fe film on glass substrate are obtained. A theory of propagation of the radiation in the multilayer medium under TER conditions is used for the interpretation of the results taking into account multiple reflections in each layer. The computer fit gives the three step depth profiles of the distribution of different hyperfine interactions in the film. [Russian Text Ignored]. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Plný text