Atomic fluorescence mapping of optical field intensity profiles issuing from nanostructured slits, milled into subwavelength metallic layers
| Autor: | G. Gay, B. Viaris de Lesegno, R. Mathevet, J. Weiner, H.J. Lezec, T.W. Ebbesen |
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| Rok vydání: | 2005 |
| Předmět: |
Atomic fluorescence
Materials science genetic structures Physics and Astronomy (miscellaneous) business.industry General Engineering General Physics and Astronomy Optical field eye diseases Metal Optics visual_art visual_art.visual_art_medium sense organs business Layer (electronics) Intensity (heat transfer) |
| Zdroj: | Applied Physics B. 81:871-874 |
| ISSN: | 1432-0649 0946-2171 |
| DOI: | 10.1007/s00340-005-2016-x |
| Popis: | We report on a direct spatial profile measurement of optical field intensity issuing from subwavelength slits flanked by periodic grooves and fabricated on a thin metallic layer. This type of structure is of interest for the manipulation of cold atoms by optical potentials near surfaces. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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