Absolute distance measurement using polarization-based spectral-domain interferometer with dual reference path
Autor: | Jonghan Jin, Yeongjun Kim, Heulbi Ahn, Jungjae Park |
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Rok vydání: | 2022 |
Zdroj: | Optical Manufacturing and Testing XIV. |
DOI: | 10.1117/12.2632344 |
Databáze: | OpenAIRE |
Externí odkaz: |