Effects of pressure on pulsed laser deposition of HgCdTe films

Autor:	X.C. Lin, Min Liu, B.Y. Man, Xin-Xiong Li
Rok vydání:	2008
Předmět:	Diffraction Crystal Crystallinity Materials science Carbon film Scanning electron microscope Analytical chemistry General Materials Science sense organs Thin film Selected area diffraction Condensed Matter Physics Pulsed laser deposition
Zdroj:	Materials Chemistry and Physics. 108:274-277
ISSN:	0254-0584
Popis:	HgCdTe thin films have been deposited on Si (1 1 1) substrates at different pressures by pulsed laser deposition (PLD). The HgCdTe thin films obtained at different pressures were characterized by X-ray diffraction (XRD), energy-dispersive X-ray analysis (EDXA), scanning electron microscopy (SEM) and selected area electron diffraction (SAED). The results show that in our experimental conditions, the thickness, crystallinity, chemical content and surface morphology of the HgCdTe thin films have a strong relation to the change of pressure. The film obtained at 5 × 10 −2 Pa has the highest crystal quality with the lowest Hg content.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2249d58f9a0f37e9c7398dd12f8d6fc0 https://doi.org/10.1016/j.matchemphys.2007.09.036 Zobrazit plný text záznamu Full Text from ScienceDirect