| Autor: |
Gerd Haeusler, Markus C. Knauer, Peter Andretzky, F. Kiesewetter |
| Rok vydání: |
2000 |
| Předmět: |
|
| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| DOI: |
10.1117/12.384174 |
| Popis: |
'Spectral radar' combines a white light interferometer with a spectrometer. It is an optical sensor for the acquisition of skin morphology based on OCT techniques. The scattering amplitude along one vertical axis from the surface into the bulk can be measured within one exposure. We will discuss some essentials of signal formation and a new method of signal evaluation that significantly reduces artifacts from some source imperfections. We will further demonstrate new measurements. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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