350.9 nm UV laser diode grown on sapphire substrate

Autor: Yasuto Miyake, Akira Honshio, Motoaki Iwaya, A. Miyazaki, Takeshi Kawashima, Kazuyoshi Iida, Isamu Akasaki, Hiroshi Amano, Hideki Kasugai, S. Mishima, S. Kamiyama
Rok vydání: 2005
Předmět:
Zdroj: physica status solidi (c). 2:2828-2831
ISSN: 1610-1634
Popis: The combination of a low-temperature-deposited AlN interlayer technology and lateral seeding epitaxy (Hetero-ELO) yielded crack-free and low-dislocation-density AlGaN. The AlGaN over the grooves has a dislocation density as low as 2 × 107 cm–2 due to the lateral growth effect, in contrast with a high dislocation density of 5 × 109cm–2 over terrace region. We demonstrated a UV-laser diode grown on this low-dislocation-density AlGaN. The ridge stripes of the UV-LD were aligned on this low-threading-dislocation-region. The lasing wavelength under pulsed current injection at room temperature was 350.9 nm. (© 2005 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)
Databáze: OpenAIRE