Accelerated Degradation Test of EVA in PV Modules by UV Pulse Laser
| Autor: | Li, Y.T., Chen, Y.W., Qiu, J.L., Hsieh, C.F., Wu, H.-S., Huang, D.R. |
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| Jazyk: | angličtina |
| Rok vydání: | 2013 |
| Předmět: | |
| ISSN: | 3017-3019 |
| DOI: | 10.4229/28theupvsec2013-4av.4.1 |
| Popis: | 28th European Photovoltaic Solar Energy Conference and Exhibition; 3017-3019 A new method of accelerated degradation test for encapsulant of solar cell modules by a UV pulse laser is proposed. A UV pulse laser at 355nm which has a repetition rate of 10 Hz , 5 ns pulse width and 20 mJ maximum pulse energy, is expanded to 1x1 cm2 to irradiate encapsulated modules. Maximum averaged energy density of 2kW/m2 is available and it could induce fast changes in net changes in yellowness index (Yi) compared with traditional high intensity UV light sources. Our result shows Yi of 10 could be achieved in 10 ~15 hours for conventional EVA encapsulant while exposed to a UV pulse laser with energy of 10~15 mJ. Such equivalent change of Yi usually takes at least 1000 hours or more by traditional light sources such as metal halide lamps or fluorescent tubes. In order to find suitable exposure energy, Yi of exposed modules at 25C are measured under the condition when laser energy is 5mJ, 10mJ, 15mJ and 20 mJ respectively. Change of Yi for exposed modules with higher temperature (60C, 5mJ) is also measured. The result could be compared with that exposed by traditional UV exposure facility (fluorescent tubes) in the future. |
| Databáze: | OpenAIRE |
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