Fine structure of scanning field emission microscope (SFEM) image

Autor:	B Barwinski, S Sendecki
Rok vydání:	1996
Předmět:	Surface (mathematics) business.industry Chemistry Magnification chemistry.chemical_element Radius Tungsten Condensed Matter Physics Scan line Surfaces Coatings and Films Field emission microscopy Field electron emission Optics Atomic resolution business Instrumentation
Zdroj:	Vacuum. 47:1479-1482
ISSN:	0042-207X
DOI:	10.1016/s0042-207x(96)00222-9
Popis:	New results of imaging of field emission tungsten tip by means of scanning field emission microscope are presented. The fine structure of the SFEM image was revealed by means of differentiation along the scan lines. The new patterns obtained in this way were explained by assuming that there are two superimposed images with different magnifications and resolutions. The revealed fine structure is assumed to be related to surface atomic structure of the tip. We supposed that the atoms can be treated as protrusions on the otherwise smooth surface. Due to the smaller radius than this for the entire tip, the protrusions show greater magnification, which results in atomic resolution.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::21ded39233dfa78cc5f3b684baef4e03 https://doi.org/10.1016/s0042-207x(96)00222-9 Zobrazit plný text záznamu Full Text from ScienceDirect