Inverse Source Solver for a High Resolution Near Field Scanner in Microelectronic Applications
| Autor: | Mei Chai, Zhiru Yu, Jason A. Mix, Qing Huo Liu, Kevin Slattery |
|---|---|
| Rok vydání: | 2014 |
| Předmět: |
Cooley–Tukey FFT algorithm
Computer science Near and far field Integrated circuit Solver Industrial and Manufacturing Engineering Electronic Optical and Magnetic Materials Computational science law.invention law Conjugate gradient method Computer Science::Mathematical Software Electronic engineering Signal integrity Electrical and Electronic Engineering Image resolution Near-field scanner |
| Zdroj: | IEEE Transactions on Components, Packaging and Manufacturing Technology. 4:1495-1502 |
| ISSN: | 2156-3985 2156-3950 |
| DOI: | 10.1109/tcpmt.2014.2339357 |
| Popis: | A potential application of inverse source solver for high resolution near field scanning of microelectronic packages is studied in this paper. A fast inverse source solver based on the fast Fourier transform algorithm and conjugate gradient algorithm is developed with a half-space Green's function. This solver can be used in microelectronic applications to solve radiation related problems, including electromagnetic interference and signal integrity of printed circuit boards or integrated circuit packagings. Simulation results show a significant improvement in image resolution and adjacent sources detectability when the inverse source solver is applied. Because of the improvements, the inverse source solver reduces the sensitivity on scan height in the near field scan process when the same source image resolution is desired. Experiments on measured data also validate the effectiveness of this solver. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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