High Energy Electron-Induced Transients In a Shielded Focal Plane Array
| Autor: | Elizabeth Auden, Robert A. Weller, Ronald D. Schrimpf, M. P. King, L A Arpin, Robert A. Reed, Makoto Asai, Marcus H. Mendenhall, N. A. Dodds |
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| Rok vydání: | 2011 |
| Předmět: |
Physics
Nuclear and High Energy Physics Range (particle radiation) Electromagnetics business.industry Monte Carlo method Bremsstrahlung Electron Radiation law.invention Optics Nuclear Energy and Engineering law Shielded cable Electromagnetic shielding Electrical and Electronic Engineering Atomic physics business |
| Zdroj: | IEEE Transactions on Nuclear Science. 58:899-905 |
| ISSN: | 1558-1578 0018-9499 |
| DOI: | 10.1109/tns.2011.2129531 |
| Popis: | Monte Carlo simulations demonstrate that electrons in a Europa-like radiation environment produce single events capable of depositing more than 100 keV in a shielded focal plane array (FPA). Aluminum shielding slows down high energy free space electrons through collisions. Incident electrons can also generate secondary particles within shielding through electromagnetic cascades, nuclear interactions, and other mechanisms. When incident electrons and secondary particles deposit energy in FPA pixels, the result is transient increases in background noise. We compare the energy deposition integral cross sections and estimate the single event effect rate for a range of electron energies incident upon an FPA shielded with 1, 5, and 10 cm of aluminum. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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