Temperature Monitoring of an EM Environment

Autor:	Rachel Banez, Clinton S. Potter, Denis Fellmann, Bridget Carragher
Rok vydání:	2006
Předmět:	Temperature monitoring General Computer Science Environmental science Remote sensing
Zdroj:	Microscopy Today. 14:24-29
ISSN:	2150-3583 1551-9295
DOI:	10.1017/s1551929500055152
Popis:	The ultimate performance of high resolution electron microscopes depends on a variety of factors including the stability of the temperature surrounding the instrument. Variations in temperature can cause drift of the specimen, the microscope electronics, and the mechanical tolerances in components such as microscope lenses and scan coils. For high resolution work or for image reconstruction that requires acquisition of multiple exposures over extended periods of time, it is critical that the temperature variations be strictly controlled. A typical manufacturer's specification for temperature stability of a room housing a transmission electron microscope (TEM) is a tolerance of
Databáze:	OpenAIRE
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