Wettability Study of SiC in Correlation with XPS Analysis

Autor:	M Anikin, Didier Chaussende, G. Berthomé, V. Thoreau, J. C. Joud, V. Stambouli
Rok vydání:	2004
Předmět:	Materials science Chemical engineering X-ray photoelectron spectroscopy Mechanics of Materials Mechanical Engineering Analytical chemistry General Materials Science Wetting Condensed Matter Physics
Zdroj:	Materials Science Forum. :423-426
ISSN:	1662-9752
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::212b28e399e683942658c89803baf95e https://doi.org/10.4028/www.scientific.net/msf.457-460.423 Zobrazit plný text záznamu