| Popis: |
New techniques of optical modulation Spectroscopy are proposed for reliable registration of real‐space electron transfer effect in semiconductor selectively doped heterostructures. In these methods, free charge carriers are heated by an electric current, RF or microwave electric fields, directed laterally to heterostructure layers. The heated electrons from high conductivity regions of a structure migrate across the sample layers and can reach sample regions with low conductivity. Such electrons transfer results in modifications of both built‐in (transverse) electric field and excitonic states that, in turn, cause the probe light reflectance to vary in energy range near the fundamental absorption edge. |
