Thermal expansion of polycrystalline gallium nitride: an X-ray diffraction study

Autor:	Roman Minikayev, C. Bähtz, Slawomir Podsiadlo, W. Paszkowicz, Michael Knapp, Paweł Piszora
Rok vydání:	2015
Předmět:	Diffraction Materials science Rietveld refinement Analytical chemistry Gallium nitride Synchrotron Thermal expansion law.invention Crystallography chemistry.chemical_compound Lattice constant chemistry law X-ray crystallography Crystallite Spectroscopy
Zdroj:	X-Ray Spectrometry. 44:382-388
ISSN:	0049-8246
DOI:	10.1002/xrs.2644
Popis:	Gallium nitride is studied at ambient and nonambient temperatures by powder X-ray diffraction followed by Rietveld refinement of the structure. The structure is reported for the ambient temperature on the basis of laboratory data. The diffraction data collected using a synchrotron beam serve for derivation of the lattice parameter and thermal expansion dependencies on temperature. The variation of unit-cell size on temperature was studied in detail in a broad range 11 K
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2101412d3a3785caba690a752a9698eb https://doi.org/10.1002/xrs.2644 Zobrazit plný text záznamu Plný text