Laboratory EXAFS spectrometer for catalyst studies
| Autor: | S. Khalid, R. Dujari, J. Shultz, J. R. Katzer, R. J. Emrich |
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| Rok vydání: | 1982 |
| Předmět: |
Materials science
Spectrometer Extended X-ray absorption fine structure Physics::Instrumentation and Detectors business.industry Astrophysics::High Energy Astrophysical Phenomena Synchrotron law.invention Crystal Optics Absorption edge law Surface-extended X-ray absorption fine structure business Absorption (electromagnetic radiation) Instrumentation Monochromator |
| Zdroj: | Review of Scientific Instruments. 53:22-33 |
| ISSN: | 1089-7623 0034-6748 |
| DOI: | 10.1063/1.1136801 |
| Popis: | A laboratory x‐ray absorption spectrometer is described which allows very high quality x‐ray absorption edge and extended x‐ray absorption fine structure (EXAFS) data to be obtained. The spectrometer utilizes a channel‐cut crystal configuration monochromator for absorption edge studies and a fully focusing Johansson cut bent crystal monchromator operated on the Rowland circle for high flux, high resolution EXAFS studies. X‐ray generation is by a rotating anode generator. Photon fluxes are about 104 higher than for a sealed‐tube flat‐crystal spectrometer; it is shown that data of quality comparable to that obtained from a synchrotron source (SSRL) can be obtained in comparable time. |
| Databáze: | OpenAIRE |
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