| Autor: |
John S. Mangum, James A. Rand, Chun-Shen Jiang, Ingrid Repins, E. Ashley Gaulding, Michael G. Deceglie, Helio Moutinho, Steve Johnston, Robert Flottemesch, Mason J. Reed, Timothy J. Silverman |
| Rok vydání: |
2021 |
| Předmět: |
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| Zdroj: |
2021 IEEE 48th Photovoltaic Specialists Conference (PVSC). |
| Popis: |
In this case study, we investigate a degradation mode occurring at the cell level in fielded multi-Si modules. Affected cells in the module show a progressive, series-resistance-related power degradation observed in module- and cell-level IV curves along with EL and PL imaging at the module, cell, and cell core sample scale. SEM and elemental analysis via EDS reveal a difference in the oxides in the silver paste used in screen printing of the finger contacts. This suggests that the cells were screen printed with different silver paste compositions and possibly firing conditions. One of these combinations leads to degradation of the contact at the interface between the cell and contact finger, causing severe series resistance across the cell that continues to progress over time. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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