Examination of ion-induced Auger electron spectra of Ti, Cr and Co in a mass-selecting Focused Ion Beam with a gold–silicon liquid metal source
| Autor: | R. Hull, H. Parvaneh |
|---|---|
| Rok vydání: | 2014 |
| Předmět: |
Auger electron spectroscopy
Auger effect Silicon Astrophysics::High Energy Astrophysical Phenomena Analytical chemistry chemistry.chemical_element Condensed Matter Physics Focused ion beam Surfaces Coatings and Films Auger Ion symbols.namesake Ion beam deposition Transition metal chemistry Physics::Plasma Physics Physics::Atomic and Molecular Clusters symbols Atomic physics Instrumentation |
| Zdroj: | Vacuum. 110:69-73 |
| ISSN: | 0042-207X |
| DOI: | 10.1016/j.vacuum.2014.08.012 |
| Popis: | Ion induced Auger electron spectroscopy is a technique where Auger electrons are produced as a result of energetic ion impact. In this paper, the ion–induced electron spectra of three of the transition metals; Ti, Cr and Co by Si ++ and Au + ions accelerated to 30 and 60 keV are studied. Aside from the low energy plasmon peaks, sharp M 23 M 45 M 45 Auger transitions with high signal to noise ratio attributed to the metal targets and, in the samples bombarded by Si ++ ions, L 23 MM transition from Si incident ion are also detected. Broad tails next to the main metal Auger peaks are attributed to interatomic transitions between the incident ion and target ions. |
| Databáze: | OpenAIRE |
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