Innovative Practices Track: What’s Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety
Autor: | Minqiang Peng, Youfa Wu, Jialiang Li, Alex Yu, Grigor Tshagharyan, Costas Argyrides, Vilas Sridharan, Gurgen Harutyunyan, Yervant Zorian, Nilanjan Mukherjee |
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Rok vydání: | 2022 |
Zdroj: | 2022 IEEE 40th VLSI Test Symposium (VTS). |
DOI: | 10.1109/vts52500.2021.9794190 |
Databáze: | OpenAIRE |
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