Innovative Practices Track: What’s Next for Automotive: Where and How to Improve Field Test and Enhance SoC Safety

Autor: Minqiang Peng, Youfa Wu, Jialiang Li, Alex Yu, Grigor Tshagharyan, Costas Argyrides, Vilas Sridharan, Gurgen Harutyunyan, Yervant Zorian, Nilanjan Mukherjee
Rok vydání: 2022
Zdroj: 2022 IEEE 40th VLSI Test Symposium (VTS).
DOI: 10.1109/vts52500.2021.9794190
Databáze: OpenAIRE