Measurement of X-ray diode photocathode sensitivity and uncertainty analysis

Autor:	Hou Li-Fei, Song Tianming, Cui Yan-Li, Yuan Yong-Teng, Zheng Lei, Yang Jia-Min, Zhu Tuo, Zhao Yi-Dong, Li Sanwei, Yi Rong-Qing, Deng Bo, Jiang Shao-En
Rok vydání:	2011
Předmět:	Optics Materials science business.industry X-ray Electrical and Electronic Engineering business Sensitivity (electronics) Atomic and Molecular Physics and Optics Photocathode Uncertainty analysis Diode
Zdroj:	High Power Laser and Particle Beams. 23:969-973
ISSN:	1001-4322
DOI:	10.3788/hplpb20112304.0969
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::2048ef6a705dd588dcbade2e64b0c88b https://doi.org/10.3788/hplpb20112304.0969 Zobrazit plný text záznamu