The formation of two-layered YBa2Cu3O7- deltasuperconducting films and their microwave surface resistance
| Autor: | Yu V Likholetov, R. A. Chakalov, Orest Vendik, V. Yu. Davydov, A.B. Kozyrev, I T Serenkov, G O Dzjuba, R N Il'in, S. F. Karmanenko, M. V. Belousov, K F Njakshev |
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| Rok vydání: | 1993 |
| Předmět: |
Superconductivity
Materials science High-temperature superconductivity Condensed matter physics business.industry Metals and Alloys Granular layer Condensed Matter Physics Microstructure law.invention Surface conductivity symbols.namesake Optics Electron diffraction law Materials Chemistry Ceramics and Composites symbols Electrical and Electronic Engineering business Layer (electronics) Raman scattering |
| Zdroj: | Superconductor Science and Technology. 6:23-29 |
| ISSN: | 1361-6668 0953-2048 |
| DOI: | 10.1088/0953-2048/6/1/002 |
| Popis: | The structure and crystallographic orientation of YBa2Cu3O7- delta films on BaxSr1-xTiO3/MgO heteroepitaxial layers were investigated by the conventional methods of electron diffraction, electron microscopy and by specific methods of Raman scattering of light and backscattering of middle-energy ions. A film of over 350 nm thick may consist of an inner highly-oriented layer and an outer disoriented one. Measurements of the microwave surface resistance Rs at 60 GHz and 4.2 K have confirmed a complicated character of the film structure. It has been shown that the microwave response of two-layer films in a static magnetic field is determined by the losses in the outer disoriented or granular layer and that the dependence Rs(H-) appeals in the field H- starting from approximately 10 Oe. |
| Databáze: | OpenAIRE |
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