Electrical properties of lightly doped p-type silicon–germanium single crystals

Autor: P. Gaworzewski, K. Tittelbach-Helmrich, N. V. Abrosimov, U. Penner
Rok vydání: 1998
Předmět:
Zdroj: Journal of Applied Physics. 83:5258-5263
ISSN: 1089-7550
0021-8979
DOI: 10.1063/1.367348
Popis: Experimental results are presented on the electrical properties of lightly boron doped bulk Si1−xGex as a function of the Ge content x in the range 0
Databáze: OpenAIRE